Blur invariant pattern recognition and registration in the Fourier domain
1University of Oulu, Faculty of Technology, Department of Electrical and Information Engineering
2University of Oulu, Infotech Oulu
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|Academic dissertation to be presented with the assent of the Faculty of Technology of the University of Oulu for public defence in Auditorium TS101, Linnanmaa, on 23 October 2009, at 12 noon
Professor Karen Egiazarian
Professor Jan Flusser
Pattern recognition and registration are integral elements of computer vision, which considers image patterns. This thesis presents novel blur, and combined blur and geometric invariant features for pattern recognition and registration related to images. These global or local features are based on the Fourier transform phase, and are invariant or insensitive to image blurring with a centrally symmetric point spread function which can result, for example, from linear motion or out of focus.
The global features are based on the even powers of the phase-only discrete Fourier spectrum or bispectrum of an image and are invariant to centrally symmetric blur. These global features are used for object recognition and image registration. The features are extended for geometrical invariances up to similarity transformation: shift invariance is obtained using bispectrum, and rotation-scale invariance using log-polar mapping of bispectrum slices. Affine invariance can be achieved as well using rotated sets of the log-log mapped bispectrum slices. The novel invariants are shown to be more robust to additive noise than the earlier blur, and combined blur and geometric invariants based on image moments.
The local features are computed using the short term Fourier transform in local windows around the points of interest. Only the lowest horizontal, vertical, and diagonal frequency coefficients are used, the phase of which is insensitive to centrally symmetric blur. The phases of these four frequency coefficients are quantized and used to form a descriptor code for the local region. When these local descriptors are used for texture classification, they are computed for every pixel, and added up to a histogram which describes the local pattern. There are no earlier textures features which have been claimed to be invariant to blur. The proposed descriptors were superior in the classification of blurred textures compared to a few non-blur invariant state of the art texture classification methods.
Acta Universitatis Ouluensis. C, Technica
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