University of Oulu

L. Yao, S. Inkinen, O. Pacherova, M. Jelinek, S. van Dijken and M. Tyunina, Phys. Chem. Chem. Phys., 2018, 20, 4263 DOI: 10.1039/C7CP08449H

Chemical-bond effect on epitaxial strain in perovskite sodium niobate

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Author: Yao, L.1; Inkinen, S.1; Pacherova, O.2;
Organizations: 1NanoSpin, Department of Applied Physics, Aalto University School of Science, P. O. Box 15100, FI-00076 Aalto, Finland
2Institute of Physics of the Czech Academy of Sciences, Na Slovance 2, 18221 Prague, Czech Republic
3Microelectronics Research Unit, Faculty of Information Technology and Electrical Engineering, University of Oulu, P. O. Box 4500, FI-90014, Finland
Format: article
Version: published version
Access: open
Online Access: PDF Full Text (PDF, 3.7 MB)
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Language: English
Published: Royal Society of Chemistry, 2018
Publish Date: 2018-03-14


Epitaxial films and heterostructures of perovskite oxides attract tremendous scientific interest because of the unique phenomena therein. Especially important is the epitaxial growth of films subjected to substrate-induced misfit strain. We show here that in contrast to conventional misfit-controlled epitaxy, chemical bonds determine the crystal stability and strain in epitaxial films of sodium niobate on different cubic substrates. Strain relaxation in sodium niobate is independent of misfit magnitude and proceeds through perovskite-specific tilting of oxygen octahedra in addition to common defect formation. The observed structural relaxation evidences a major role of a large internal strain that originates from chemical bonds in the perovskite cell. The effect of chemical bonds on film strain is anticipated to also control the epitaxy of other perovskite oxides and related compounds.

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Series: Physical chemistry chemical physics
ISSN: 1463-9076
ISSN-E: 1463-9084
ISSN-L: 1463-9076
Volume: 20
Issue: 6
Pages: 4263 - 4268
DOI: 10.1039/c7cp08449h
Type of Publication: A1 Journal article – refereed
Field of Science: 116 Chemical sciences
213 Electronic, automation and communications engineering, electronics
Funding: The authors acknowledge support from the Academy of Finland (Grant No. 293929 and 304291), the European Research Council (ERC-2012-StG 307502), the Grant Agency of the Czech Republic (Grant No. 15-15123S) and Infotech Oulu of the University of Oulu.
Copyright information: © 2018 The Authors. This article is licensed under a Creative Commons Attribution 3.0 Unported Licence.