University of Oulu

J. P. Aikio, J. Kostamovaara, M. Berg and E. T. Salonen, "On the microwave photonics based pulsed-time-of-flight techniques in the measurement of the thickness of dielectric sheets," 2017 IEEE International Instrumentation and Measurement Technology Conference (I2MTC), Turin, 2017, pp. 1-6. doi: 10.1109/I2MTC.2017.7969831

On the microwave photonics based pulsed-time-of-flight techniques in the measurement of the thickness of dielectric sheets

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Author: Aikio, Janne P.1; Kostamovaara, Juha1; Berg, Markus2;
Organizations: 1Circuits and Systems Research Unit UNIVERSITY OF OULU Oulu, Finland
2Centre for Wireless Communications Radio Technologies Research Unit UNIVERSITY OF OULU Oulu, Finland
Format: article
Version: accepted version
Access: open
Online Access: PDF Full Text (PDF, 0.5 MB)
Persistent link: http://urn.fi/urn:nbn:fi-fe2018062926664
Language: English
Published: Institute of Electrical and Electronics Engineers, 2017
Publish Date: 2018-06-29
Description:

Abstract

This paper proposes a time domain measurement technique for characterizing the thickness of dielectric material based on pulse-domain microwave photonics and pulsed time-of-flight configuration. Short laser pulses from a semiconductor laser diode are converted to electrical pulses using a wideband photodetector. These pulses are fed to an antenna, providing a simple and accurate non-destructive measurement technique for material characterization. The thickness of the sample is calculated based on the propagation delay of a radio wave by measuring the transit time of a short electromagnetic pulse. The propagation delay is determined from the front edge of the energy envelope. Results show that the measured propagation delay is linearly dependent on the sample thickness. The technique achieves a measurement precision in the sub-mm range with a measurement time of 40ms.

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ISBN: 978-1-5090-3596-0
ISBN Print: 978-1-5090-3597-7
Pages: 1 - 6
DOI: 10.1109/I2MTC.2017.7969831
OADOI: https://oadoi.org/10.1109/I2MTC.2017.7969831
Host publication: 2017 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)
Conference: IEEE International Instrumentation and Measurement Technology Conference
Type of Publication: A4 Article in conference proceedings
Field of Science: 213 Electronic, automation and communications engineering, electronics
Subjects:
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