University of Oulu

G. L. Ramos, P. Kyösti, V. Hovinen and M. Latva-aho, "Multiple-Screen Diffraction Measurement at 10–18 GHz," in IEEE Antennas and Wireless Propagation Letters, vol. 16, pp. 2002-2005, 2017. doi: 10.1109/LAWP.2017.2692818

Multiple-screen diffraction measurement at 10-18 GHz

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Author: Ramos, Glaucio1; Kyösti, Pekka2,3; Hovinen, Veikko4;
Organizations: 1Antennas and Propagation Research Group, Federal University of São João del-Rei, São João del-Rei 36307-352, Brazil
2Centre for Wireless Communications, University of Oulu, Oulu 90014, Finland
3Keysight Technologies Finland Oy, Oulu 90590, Finland
4Centre for Wireless Communications, University of Oulu, Oulu 90590, Finland
Format: article
Version: accepted version
Access: open
Online Access: PDF Full Text (PDF, 0.3 MB)
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Language: English
Published: Institute of Electrical and Electronics Engineers, 2017
Publish Date: 2018-08-06


This letter presents analysis of diffraction over multiple shadowing screens at frequency range of 10–18 GHz. Up to ten pieces of thin metal sheets with dimensions of 130 × 100 cm at variable spacing were used as diffraction screens. The aim of this study is to investigate the total shadowing effect of multiple knife-edge diffractions at frequencies above the legacy cellular systems. The results show the necessity to adjust the Walfisch-Bertoni path loss model for the higher frequencies in the future fifth-generation systems.

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Series: IEEE antennas and wireless propagation letters
ISSN: 1536-1225
ISSN-E: 1548-5757
ISSN-L: 1536-1225
Volume: 16
Pages: 2002 - 2005
DOI: 10.1109/LAWP.2017.2692818
Type of Publication: A1 Journal article – refereed
Field of Science: 213 Electronic, automation and communications engineering, electronics
Funding: This work was supported in part by the CNPq 446648/2014-0 and CAPES/PROCAD 068419/2014-01, and in part by the Finnish Funding Agency for Technology and Innovation (Tekes), Huawei Technologies, Nokia, and Keysight Technologies Finland Oy within the framework of 5G to 10G Project.
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