Multiple-screen diffraction measurement at 10-18 GHz |
|
Author: | Ramos, Glaucio1; Kyösti, Pekka2,3; Hovinen, Veikko4; |
Organizations: |
1Antennas and Propagation Research Group, Federal University of São João del-Rei, São João del-Rei 36307-352, Brazil 2Centre for Wireless Communications, University of Oulu, Oulu 90014, Finland 3Keysight Technologies Finland Oy, Oulu 90590, Finland
4Centre for Wireless Communications, University of Oulu, Oulu 90590, Finland
|
Format: | article |
Version: | accepted version |
Access: | open |
Online Access: | PDF Full Text (PDF, 0.3 MB) |
Persistent link: | http://urn.fi/urn:nbn:fi-fe2018080633407 |
Language: | English |
Published: |
Institute of Electrical and Electronics Engineers,
2017
|
Publish Date: | 2018-08-06 |
Description: |
AbstractThis letter presents analysis of diffraction over multiple shadowing screens at frequency range of 10–18 GHz. Up to ten pieces of thin metal sheets with dimensions of 130 × 100 cm at variable spacing were used as diffraction screens. The aim of this study is to investigate the total shadowing effect of multiple knife-edge diffractions at frequencies above the legacy cellular systems. The results show the necessity to adjust the Walfisch-Bertoni path loss model for the higher frequencies in the future fifth-generation systems. see all
|
Series: |
IEEE antennas and wireless propagation letters |
ISSN: | 1536-1225 |
ISSN-E: | 1548-5757 |
ISSN-L: | 1536-1225 |
Volume: | 16 |
Pages: | 2002 - 2005 |
DOI: | 10.1109/LAWP.2017.2692818 |
OADOI: | https://oadoi.org/10.1109/LAWP.2017.2692818 |
Type of Publication: |
A1 Journal article – refereed |
Field of Science: |
213 Electronic, automation and communications engineering, electronics |
Subjects: | |
Funding: |
This work was supported in part by the CNPq 446648/2014-0 and CAPES/PROCAD 068419/2014-01, and in part by the Finnish Funding Agency for Technology and Innovation (Tekes), Huawei Technologies, Nokia, and Keysight Technologies Finland Oy within the framework of 5G to 10G Project.
|
Copyright information: |
© 2017 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. |