J. Kokkoniemi, J. Lehtomäki and M. Juntti, "Stochastic Geometry Analysis for Mean Interference Power and Outage Probability in THz Networks," in IEEE Transactions on Wireless Communications, vol. 16, no. 5, pp. 3017-3028, May 2017. doi: 10.1109/TWC.2017.2673844
Stochastic geometry analysis for mean interference power and outage probability in THz networks
|Author:||Kokkoniemi, Joonas1; Lehtomäki, Janne1; Juntti, Markku1|
1Centre for Wireless Communications, Faculty of Information Technology and Electrical Engineering, University of Oulu, 90014 Oulu, Finland
|Online Access:||PDF Full Text (PDF, 2 MB)|
|Persistent link:|| http://urn.fi/urn:nbn:fi-fe2018080733482
Institute of Electrical and Electronics Engineers,
|Publish Date:|| 2018-08-07
Mean interference power and probability of outage in the THz band (0.1-10 THz) networks are studied. The frequency band has potential for enabling future short range communication systems because of the large available spectrum resources. This can enable huge data rates, or on the other hand, large numbers of users sharing the resources. The latter case is closely related to the subject of this paper on interference modeling for dense THz networks with stochastic geometry. We use it to estimate the average behavior of random networks. The literature has shown convenient closed form solutions for the mean interference power in ultrahigh frequency band (UHF, 300 MHz - 3 GHz). Those are not always readily applicable for the THz band. This is especially the case when THz band is modeled with the molecular absorption and free space path loss. Still, the mean interference power does have closed form solutions in all cases, but in some, numerical approximations have to be used. We provide the derivation and analysis of the mean interference power and the outage probability. The results are verified with computer simulations.
IEEE transactions on wireless communications
|Pages:||3017 - 3028|
|Type of Publication:||
A1 Journal article – refereed
|Field of Science:||
213 Electronic, automation and communications engineering, electronics
J. Kokkoniemi would like to thank the following foundations for their support: Riitta ja Jorma J. Takasen säätiö, Walter Ahlströmin säätiö, Tauno Tönningin säätiö, Ulla Tuomisen säätiö, and Nokia Foundation.
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