Quantification of bonded Ni atoms for Ni-MoS₂ metallic contact through X-ray photoemission electron microscopy
Shi, Xinying; Huttula, Marko; Pankratov, Vladimir; Hoszowska, Joanna; Dousse, Jean-Claude; Zeeshan, Faisal; Niu, Yuran; Zakharov, Alexei; Huang, Zhongjia; Wang, Gang; Posysaev, Sergei; Miroshnichenko, Olga; Alatalo, Matti; Cao, Wei (2018-08-10)
Shi, Xinying
Huttula, Marko
Pankratov, Vladimir
Hoszowska, Joanna
Dousse, Jean-Claude
Zeeshan, Faisal
Niu, Yuran
Zakharov, Alexei
Huang, Zhongjia
Wang, Gang
Posysaev, Sergei
Miroshnichenko, Olga
Alatalo, Matti
Cao, Wei
Cambridge University Press
10.08.2018
Shi, X., Huttula, M., Pankratov, V., Hoszowska, J., Dousse, J., Zeeshan, F., ...Cao, W. (2018). Quantification of Bonded Ni Atoms for Ni-MoS2 Metallic Contact through X-ray Photoemission Electron Microscopy. Microscopy and Microanalysis, 24(S2), 458-459. doi:10.1017/S1431927618014526
https://rightsstatements.org/vocab/InC/1.0/
© Microscopy Society of America 2018.
https://rightsstatements.org/vocab/InC/1.0/
© Microscopy Society of America 2018.
https://rightsstatements.org/vocab/InC/1.0/
Julkaisun pysyvä osoite on
https://urn.fi/URN:NBN:fi-fe2018082834233
https://urn.fi/URN:NBN:fi-fe2018082834233
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