University of Oulu

Shi, X., Huttula, M., Pankratov, V., Hoszowska, J., Dousse, J., Zeeshan, F., . . . Cao, W. (2018). Quantification of Bonded Ni Atoms for Ni-MoS2 Metallic Contact through X-ray Photoemission Electron Microscopy. Microscopy and Microanalysis, 24(S2), 458-459. doi:10.1017/S1431927618014526

Quantification of bonded Ni atoms for Ni-MoS₂ metallic contact through X-ray photoemission electron microscopy

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Author: Shi, Xinying1; Huttula, Marko1; Pankratov, Vladimir1;
Organizations: 1Nano and Molecular Systems Research Unit, University of Oulu, FI-90014, Oulu, Finland
2Department of Physics, University of Fribourg, Ch. du Musée 3, CH-1700 Fribourg, Switzerland
3MAX IV Laboratory, Lund University, P.O. Box 118, 22100, Lund, Sweden
4School of Mechanical and Automotive Engineering, Anhui Polytechnic University, Wuhu, China
Format: article
Version: accepted version
Access: embargoed
Persistent link: http://urn.fi/urn:nbn:fi-fe2018082834233
Language: English
Published: Cambridge University Press, 2018
Publish Date: 2019-02-10
Series: Microscopy and microanalysis
ISSN: 1431-9276
ISSN-E: 1435-8115
ISSN-L: 1431-9276
Volume: 24
Issue: S2
Pages: 458 - 459
DOI: 10.1017/S1431927618014526
OADOI: https://oadoi.org/10.1017/S1431927618014526
Type of Publication: A1 Journal article – refereed
Field of Science: 114 Physical sciences
Subjects:
Funding: The authors acknowledge funding from the European Commission’s Seventh Framework Programme (FP7/2007–2013) CALIPSO (Grant No. 312284). X.S. thanks the scholarship sponsored by China Scholarship Council. J.H., J.-Cl.D. and F.Z. acknowledge the financial support of the Swiss National Science Foundation (Grant No. 200020_146739).
Copyright information: © Microscopy Society of America 2018.