University of Oulu

M. Bennis, M. Debbah and H. V. Poor, "Ultrareliable and Low-Latency Wireless Communication: Tail, Risk, and Scale," in Proceedings of the IEEE, vol. 106, no. 10, pp. 1834-1853, Oct. 2018. doi: 10.1109/JPROC.2018.2867029

Ultrareliable and low-latency wireless communication : tail, risk, and scale

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Author: Bennis, Mehdi1; Debbah, Mérouane2; Poor, H. Vincent3
Organizations: 1Centre for Wireless Communications, University of Oulu
2Mathematical and Algorithmic Sciences Lab, Huawei France R&D
3Department of Electrical Engineering, Princeton University
Format: article
Version: accepted version
Access: open
Online Access: PDF Full Text (PDF, 1.7 MB)
Persistent link: http://urn.fi/urn:nbn:fi-fe2018110247072
Language: English
Published: Institute of Electrical and Electronics Engineers, 2018
Publish Date: 2018-11-02
Description:

Abstract

Ensuring ultrareliable and low-latency communication (URLLC) for 5G wireless networks and beyond is of capital importance and is currently receiving tremendous attention in academia and industry. At its core, URLLC mandates a departure from expected utility-based network design approaches, in which relying on average quantities (e.g., average throughput, average delay, and average response time) is no longer an option but a necessity. Instead, a principled and scalable framework which takes into account delay, reliability, packet size, network architecture and topology (across access, edge, and core), and decision-making under uncertainty is sorely lacking. The overarching goal of this paper is a first step to filling this void. Towards this vision, after providing definitions of latency and reliability, we closely examine various enablers of URLLC and their inherent tradeoffs. Subsequently, we focus our attention on a wide variety of techniques and methodologies pertaining to the requirements of URLLC, as well as their applications through selected use cases. These results provide crisp insights for the design of low-latency and high-reliability wireless networks.

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Series: Proceedings of the IEEE
ISSN: 0018-9219
ISSN-E: 1558-2256
ISSN-L: 0018-9219
Volume: 106
Issue: 10
Pages: 1834 - 1853
DOI: 10.1109/JPROC.2018.2867029
OADOI: https://oadoi.org/10.1109/JPROC.2018.2867029
Type of Publication: A1 Journal article – refereed
Field of Science: 213 Electronic, automation and communications engineering, electronics
Subjects:
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