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On the effects of the excess bias of the SPAD on the timing accuracy in time interval measurement |
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| Author: | Nissinen, J.1; Nissinen, I.1; Huikari, J.1; |
| Organizations: |
1University of Oulu, Circuits and Systems Research Unit, Oulu, Finland |
| Format: | article |
| Version: | accepted version |
| Access: | open |
| Online Access: | PDF Full Text (PDF, 0.3 MB) |
| Persistent link: | http://urn.fi/urn:nbn:fi-fe2018121350847 |
| Language: | English |
| Published: |
Institute of Electrical and Electronics Engineers,
2017
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| Publish Date: | 2018-12-13 |
| Description: |
AbstractThe timing accuracy of a single-photon avalanche diode (SPAD) based receiver is analyzed as a function of excess bias voltage. The width of the used optical pulse was 100 ps, which matches well with the jitter of the used SPAD receiver fabricated in a 0.35 pm HVCMOS technology. The timing error was measured to be 900 ps within the excess bias voltage range of ~1.25 V-3.25 V. The single-shot resolution changes from 420 ps to 160 ps (FWHM), respectively. see all
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| Series: |
Proceedings of IEEE Sensors |
| ISSN: | 1930-0395 |
| ISSN-E: | 2168-9237 |
| ISSN-L: | 1930-0395 |
| ISBN: | 978-1-5090-1012-7 |
| ISBN Print: | 978-1-5090-1013-4 |
| Article number: | 8233996 |
| DOI: | 10.1109/ICSENS.2017.8233996 |
| OADOI: | https://oadoi.org/10.1109/ICSENS.2017.8233996 |
| Host publication: |
Proceedings of IEEE Sensors, 29 Oct.-1.Nov. 2017, Glasgow, UK |
| Conference: |
IEEE SENSORS |
| Type of Publication: |
A4 Article in conference proceedings |
| Field of Science: |
213 Electronic, automation and communications engineering, electronics |
| Subjects: | |
| Funding: |
This work was supported by the Academy of Finland, Centre of Excellence in Laser Scanning Research under Contract 272196, and Contracts 282405 and 292609. |
| Academy of Finland Grant Number: |
282405 292609 272196 |
| Detailed Information: |
282405 (Academy of Finland Funding decision) 292609 (Academy of Finland Funding decision) 272196 (Academy of Finland Funding decision) |
| Copyright information: |
© 2017 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. |