J. Nissinen, I. Nissinen, J. Huikari, S. Jahromi, J. -. Jansson and J. Kostamovaara, "On the effects of the excess bias of the SPAD on the timing accuracy in time interval measurement," 2017 IEEE SENSORS, Glasgow, 2017, pp. 1-3. doi: 10.1109/ICSENS.2017.8233996
On the effects of the excess bias of the SPAD on the timing accuracy in time interval measurement
|Author:||Nissinen, J.1; Nissinen, I.1; Huikari, J.1;|
1University of Oulu, Circuits and Systems Research Unit, Oulu, Finland
|Online Access:||PDF Full Text (PDF, 0.3 MB)|
|Persistent link:|| http://urn.fi/urn:nbn:fi-fe2018121350847
Institute of Electrical and Electronics Engineers,
|Publish Date:|| 2018-12-13
The timing accuracy of a single-photon avalanche diode (SPAD) based receiver is analyzed as a function of excess bias voltage. The width of the used optical pulse was 100 ps, which matches well with the jitter of the used SPAD receiver fabricated in a 0.35 pm HVCMOS technology. The timing error was measured to be 900 ps within the excess bias voltage range of ~1.25 V-3.25 V. The single-shot resolution changes from 420 ps to 160 ps (FWHM), respectively.
Proceedings of IEEE Sensors
Proceedings of IEEE Sensors, 29 Oct.-1.Nov. 2017, Glasgow, UK
|Type of Publication:||
A4 Article in conference proceedings
|Field of Science:||
213 Electronic, automation and communications engineering, electronics
This work was supported by the Academy of Finland, Centre of Excellence in Laser Scanning Research under Contract 272196, and Contracts 282405 and 292609.
|Academy of Finland Grant Number:||
282405 (Academy of Finland Funding decision)
292609 (Academy of Finland Funding decision)
272196 (Academy of Finland Funding decision)
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