University of Oulu

I. Nissinen, J. Nissinen and J. Kostamovaara, "Effects of the inhomogeneity of the time resolving CMOS single-photon avalanche diode array on time-gated Raman spectroscopy," 2017 IEEE International Instrumentation and Measurement Technology Conference (I2MTC), Turin, 2017, pp. 1-6. doi: 10.1109/I2MTC.2017.7969713

Effects of the inhomogeneity of the time resolving CMOS single-photon avalanche diode array on time-gated Raman spectroscopy

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Author: Nissinen, Ilkka1; Nissinen, Jan1; Kostamovaara, Juha1
Organizations: 1Circuits and Systems Research Unit University of Oulu
Format: article
Version: accepted version
Access: open
Online Access: PDF Full Text (PDF, 0.7 MB)
Persistent link: http://urn.fi/urn:nbn:fi-fe2018121450854
Language: English
Published: Institute of Electrical and Electronics Engineers, 2017
Publish Date: 2018-12-14
Description:

Abstract

The effects of the inhomogeneity of a time resolving CMOS single-photon avalanche diode array on the fluorescence-suppressed, time-gated, Raman spectroscopy device was experimentally studied here. Raman spectroscopy device using a 532 nm pulsed laser and a single time resolving single-photon avalanche diode (SPAD) with a micro step motor was developed to study these effects. A single SPAD with a step motor allows us to test the performance which could be achieved with an ideal line detector without any nonlinearities and inhomogeneities because the same SPAD and time interval measurement unit is used in every spectral point. Additionally, the single element can be replaced by a SPAD array with an on-chip time-to-digital converter (TDC) to make comparison measurements to clarify the effects of inhomogeneity. These comparison measurements were made by using an array of 256 elements with an on-chip 100 ps TDC and showed that the deterioration of Raman spectra is larger when fluorescence lifetimes and levels are shorter and higher, respectively.

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ISBN Print: 978-1-5090-3596-0
DOI: 10.1109/I2MTC.2017.7969713
OADOI: https://oadoi.org/10.1109/I2MTC.2017.7969713
Host publication: 2017 IEEE International Instrumentation and Measurement Technology Conference (I2MTC 2017) Proceedings
Conference: 2017 IEEE International Instrumentation and Measurement Technology Conference (I2MTC 2017)
Type of Publication: A4 Article in conference proceedings
Field of Science: 213 Electronic, automation and communications engineering, electronics
Subjects:
Funding: This work was supported by the Academy of Finland (Centre of Excellence in Laser Scanning Research, contract no. 272196, and contract nos. 282405 and 292609)
Academy of Finland Grant Number: 272196
282405
292609
Detailed Information: 272196 (Academy of Finland Funding decision)
282405 (Academy of Finland Funding decision)
292609 (Academy of Finland Funding decision)
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