University of Oulu

H. Ruokamo, H. Rapakko and J. Kostamovaara, "An 80 × 25 pixel CMOS single-photon image sensor with sub-ns time gating for solid state 3D scanning," 2017 13th Conference on Ph.D. Research in Microelectronics and Electronics (PRIME), Giardini Naxos, 2017, pp. 365-368. doi: 10.1109/PRIME.2017.7974183

An 80 × 25 pixel CMOS single-photon image sensor with sub-ns time gating for solid state 3D scanning

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Author: Ruokamo, Henna1; Rapakko, Harri1; Kostamovaara, Juha1
Organizations: 1Faculty of Information Technology and Electrical Engineering, Circuits and Systems Research Unit, University of Oulu, Finland
Format: article
Version: accepted version
Access: open
Online Access: PDF Full Text (PDF, 0.3 MB)
Persistent link: http://urn.fi/urn:nbn:fi-fe2018122051448
Language: English
Published: Institute of Electrical and Electronics Engineers, 2017
Publish Date: 2018-12-20
Description:

Abstract

Imager topology with sub-ns time gating for 3D distance measurement application and first measurement results of the prototype are presented. The imager has a fully digital operating principle with single-photon avalanche diode detectors and on-chip narrow gating of pixel groups. The prototype detector has 80 × 25 pixels with a fill factor of 34 % in the sensor area. The chip has been fabricated in a 0.35 μm high-voltage process and occupies 5.69 × 5.02 mm2 area.

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ISBN: 978-1-5090-6508-0
ISBN Print: 978-1-5090-6507-3
Pages: 365 - 368
DOI: 10.1109/PRIME.2017.7974183
OADOI: https://oadoi.org/10.1109/PRIME.2017.7974183
Host publication: 2017 13th Conference on Ph.D. Research in Microelectronics and Electronics (PRIME)
Conference: Conference on Ph.D. Research in Microelectronics and Electronics
Type of Publication: A4 Article in conference proceedings
Field of Science: 213 Electronic, automation and communications engineering, electronics
Subjects:
Funding: The authors acknowledge financial support from the Academy of Finland (Centre of Excellence in Laser Scanning Research) and the Infotech Oulu Graduate School.
Copyright information: © 2017 IEEE. Translations and content mining are permitted for academic research only. Personal use is also permitted, but republication/redistribution requires IEEE permission.