Detecting defects in photovoltaic panels with the help of synchronized thermography |
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Author: | Schuss, Christian1; Remes, Kari2; Leppänen, Kimmo3; |
Organizations: |
1Circuits and Systems Research Unit, University of Oulu, 90014 Oulu, Finland 2Optoelectronics and Measurement Techniques Research Unit, University of Oulu, 90014 Oulu, Finland 3Mettler-Toledo GmbH, SBU AutoChem, 8603 Schwerzenbach, Switzerland
4Institute of Electronic Sensor Systems, Graz University of Technology, 8010 Graz, Austria
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Format: | article |
Version: | accepted version |
Access: | open |
Online Access: | PDF Full Text (PDF, 4.2 MB) |
Persistent link: | http://urn.fi/urn:nbn:fi-fe201902205809 |
Language: | English |
Published: |
Institute of Electrical and Electronics Engineers,
2018
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Publish Date: | 2019-02-20 |
Description: |
AbstractThis paper investigates defects in photovoltaic (PV) panels, more precisely, the location of defects in PV panels. With the help of electrical verification, it is possible to verify the impact of defects on output performances. However, it is not possible to determine the location of defects in order to address the origin of problems, for example, in the manufacturing process of PV panels. In this paper, the focus lies on finding similarities in the location of defect areas in PV panels. Samples were characterized with the help of synchronized thermography and time-resolved thermography in order to obtain infrared (IR) images of PV panels. IR images are helpful to obtain a visual image on the health of PV panels, identify the position of defects, and estimate the influence of defects on the output power. This information can be useful, for example, for improving the fabrication process of PV panels. see all
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Series: |
IEEE transactions on instrumentation and measurement |
ISSN: | 0018-9456 |
ISSN-E: | 1557-9662 |
ISSN-L: | 0018-9456 |
Volume: | 67 |
Issue: | 5 |
Pages: | 1178 - 1186 |
DOI: | 10.1109/TIM.2018.2809078 |
OADOI: | https://oadoi.org/10.1109/TIM.2018.2809078 |
Type of Publication: |
A1 Journal article – refereed |
Field of Science: |
213 Electronic, automation and communications engineering, electronics |
Subjects: | |
Copyright information: |
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