University of Oulu

C. Schuss et al., "Detecting Defects in Photovoltaic Panels With the Help of Synchronized Thermography," in IEEE Transactions on Instrumentation and Measurement, vol. 67, no. 5, pp. 1178-1186, May 2018. doi: 10.1109/TIM.2018.2809078

Detecting defects in photovoltaic panels with the help of synchronized thermography

Saved in:
Author: Schuss, Christian1; Remes, Kari2; Leppänen, Kimmo3;
Organizations: 1Circuits and Systems Research Unit, University of Oulu, 90014 Oulu, Finland
2Optoelectronics and Measurement Techniques Research Unit, University of Oulu, 90014 Oulu, Finland
3Mettler-Toledo GmbH, SBU AutoChem, 8603 Schwerzenbach, Switzerland
4Institute of Electronic Sensor Systems, Graz University of Technology, 8010 Graz, Austria
Format: article
Version: accepted version
Access: open
Online Access: PDF Full Text (PDF, 4.2 MB)
Persistent link:
Language: English
Published: Institute of Electrical and Electronics Engineers, 2018
Publish Date: 2019-02-20


This paper investigates defects in photovoltaic (PV) panels, more precisely, the location of defects in PV panels. With the help of electrical verification, it is possible to verify the impact of defects on output performances. However, it is not possible to determine the location of defects in order to address the origin of problems, for example, in the manufacturing process of PV panels. In this paper, the focus lies on finding similarities in the location of defect areas in PV panels. Samples were characterized with the help of synchronized thermography and time-resolved thermography in order to obtain infrared (IR) images of PV panels. IR images are helpful to obtain a visual image on the health of PV panels, identify the position of defects, and estimate the influence of defects on the output power. This information can be useful, for example, for improving the fabrication process of PV panels.

see all

Series: IEEE transactions on instrumentation and measurement
ISSN: 0018-9456
ISSN-E: 1557-9662
ISSN-L: 0018-9456
Volume: 67
Issue: 5
Pages: 1178 - 1186
DOI: 10.1109/TIM.2018.2809078
Type of Publication: A1 Journal article – refereed
Field of Science: 213 Electronic, automation and communications engineering, electronics
Copyright information: © 2018 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.