Jobin Varghese, Tuomo Siponkoski, Mikko Nelo, Mailadil Thomas Sebastian, Heli Jantunen. Microwave dielectric properties of low-temperature sinterable α-MoO3. Journal of the European Ceramic Society, Volume 38, Issue 4, 2018. Pages 1541-1547, ISSN 0955-2219, https://doi.org/10.1016/j.jeurceramsoc.2017.11.027
Microwave dielectric properties of low-temperature sinterable α-MoO3
|Author:||Varghese, Jobin1; Siponkoski, Tuomo1; Nelo, Mikko1;|
1Microelectronics Research Unit, Faculty of Information Technology and Electrical Engineering, P- O. BOX 4500, University of Oulu, 90014, Finland
|Persistent link:|| http://urn.fi/urn:nbn:fi-fe201902215853
|Publish Date:|| 2019-11-11
The α-MoO3 ceramics were prepared by uniaxial pressing and sintering of MoO3 powder at 650 °C and their structure, microstructure, densification and sintering and microwave dielectric properties were investigated. The sintering temperature of α-MoO3 was optimized based on the best densification and microwave dielectric properties. After sintering at 650 °C the relative permittivity was found to be 6.6 and the quality factor was 41,000 GHz at 11.3 GHz. The full-width half-maximum of the A1g Raman mode of bulk α-MoO3 at different sintering temperatures correlated well with the Qf values. Moreover, the sintered samples showed a temperature coefficient of the resonant frequency of −25 ppm/°C in the temperature range from −40 to 85 °C and they exhibited a very low coefficient of thermal expansion of ±4 ppm/°C. These microwave dielectric properties of α-MoO3 will be of great benefit in future MoO3 based materials and their applications.
Journal of the European Ceramic Society
|Pages:||1541 - 1547|
|Type of Publication:||
A1 Journal article – refereed
|Field of Science:||
213 Electronic, automation and communications engineering, electronics
114 Physical sciences
116 Chemical sciences
216 Materials engineering
The authors are thankful to European Research Council Project No: 24001893 for financial support. Also, Mr. Santtu Heinilehto (Application Engineer) for XPS and Mr. Pekka Moilanen for Raman spectroscopy measurements are acknowledged.
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