University of Oulu

Rashad Hajimammadov, Melinda Mohl & Krisztian Kordas. Native oxide formation on pentagonal copper nanowires: A TEM study. In Surface Science, Volumes 672–673, 2018, Pages 19-22, ISSN 0039-6028. https://doi.org/10.1016/j.susc.2018.03.005

Native oxide formation on pentagonal copper nanowires : a TEM study

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Author: Hajimammadov, Rashad1; Mohl, Melinda1; Kordas, Krisztian1
Organizations: 1Microelectronics Research Unit, Faculty of Information Technology and Electrical Engineering, University of Oulu, P.O. Box 4500, 90570 Oulu, Finland
Format: article
Version: accepted version
Access: embargoed
Persistent link: http://urn.fi/urn:nbn:fi-fe201902286560
Language: English
Published: Elsevier, 2018
Publish Date: 2020-03-08
Description:

Abstract

Hydrothermally synthesized copper nanowires were allowed to oxidize in air at room temperature and 30% constant humidity for the period of 22 days. The growth of native oxide layer was followed up by high-resolution transmission electron microscopy and diffraction to reveal and understand the kinetics of the oxidation process. Copper oxides appear in the form of differently oriented crystalline phases around the metallic core as a shell-like layer (Cu2O) and as nanoscopic islands (CuO) on the top of that. Time dependent oxide thickness data suggests that oxidation follows the field-assisted growth model at the beginning of the process, as practically immediately an oxide layer of ∼2.8 nm thickness develops on the surface. However, after this initial rapid growth, the local field attenuates and the classical parabolic diffusion limited growth plays the main role in the oxidation. Because of the single crystal facets on the side surface of penta-twinned Cu nanowires, the oxidation rate in the diffusion limited regime is lower than in polycrystalline films.

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Series: Surface science. A journal devoted to the physics and chemistry of interfaces
ISSN: 0039-6028
ISSN-E: 0039-6028
ISSN-L: 0039-6028
Volume: 672
Pages: 19 - 22
DOI: 10.1016/j.susc.2018.03.005
OADOI: https://oadoi.org/10.1016/j.susc.2018.03.005
Type of Publication: A1 Journal article – refereed
Field of Science: 216 Materials engineering
213 Electronic, automation and communications engineering, electronics
Subjects:
Funding: Authors thank Sami Saukko (Nanotechnology and Microscopy Center, University of Oulu) for his assistance in TEM imaging. R. H. acknowledges funding received from the University of Oulu Graduate School, Advanced Materials Doctoral Programme. Support received from the Academy of Finland (project SuPlaCat) and University of Oulu (More than Moore research community) is acknowledged.
Copyright information: © 2018 Elsevier B.V. All rights reserved. This manuscript version is made available under the CC-BY-NC-ND 4.0 license http://creativecommons.org/licenses/by-nc-nd/4.0/.
  https://creativecommons.org/licenses/by-nc-nd/4.0/