University of Oulu

P. Kyösti, L. Hentilä, J. Kyröläinen, F. Zhang, W. Fan and M. Latva-aho, "Emulating dynamic radio channels for radiated testing of massive MIMO devices," 12th European Conference on Antennas and Propagation (EuCAP 2018), London, 2018, pp. 1-5. doi: 10.1049/cp.2018.0858

Emulating dynamic radio channels for radiated testing of massive MIMO devices

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Author: Kyösti, Pekka1,2; Hentilä, Lassi1; Kyröläinen, Jukka1;
Organizations: 1Keysight Technologies Finland oy, Oulu, Finland
2University of Oulu, CWC, Oulu, Finland
3Department of Electronic Systems, Aalborg University, Denmark
4Department of Electronic Systems, Aalborg University
Format: article
Version: accepted version
Access: open
Online Access: PDF Full Text (PDF, 1.3 MB)
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Language: English
Published: Institution of Engineering and Technology, 2018
Publish Date: 2019-04-04


This paper discusses a multi-probe anechoic chamber setup, capable of reconstructing non-stationary radio propagation environments for testing of millimetre wave and massive Multiple-Input-Multiple-Output devices. The test setup is aimed for evaluation of end to end performance of devices, including hybrid beamforming operations of antenna arrays and base band processing, in highly time variant channel conditions. In this work we present simulated comparison of an ideal reference radio channel model and corresponding model implemented with limited resources of multi-probe anechoic chamber components. We give a qualitative analysis of the results with non-line of sight channel models, without quantitative evaluation. The example device under test is a 8 × 8 planar array with half wavelength inter-element spacing.

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ISBN: 978-1-78561-816-1
ISBN Print: 978-1-78561-815-4
Article number: 8568536
DOI: 10.1049/cp.2018.0858
Host publication: 12th European Conference on Antennas and Propagation (EuCAP 2018)
Conference: European Conference on Antennas and Propagation
Type of Publication: A4 Article in conference proceedings
Field of Science: 213 Electronic, automation and communications engineering, electronics
Copyright information: © 2018 The Authors and IET. This paper is a postprint of a paper submitted to and accepted for publication in [journal] and is subject to Institution of Engineering and Technology Copyright. The copy of record is available at the IET Digital Library.