Focus classification in digital holographic microscopy using deep convolutional neural networks
Pitkäaho, Tomi; Manninen, Aki; Naughton, Thomas J. (2017-07-28)
Pitkäaho, Tomi
Manninen, Aki
Naughton, Thomas J.
SPIE
28.07.2017
Tomi Pitkäaho, Aki Manninen, and Thomas J. Naughton "Focus classification in digital holographic microscopy using deep convolutional neural networks", Proc. SPIE 10414, Advances in Microscopic Imaging, 104140K (28 July 2017); doi: 10.1117/12.2286161; https://doi.org/10.1117/12.2286161
https://rightsstatements.org/vocab/InC/1.0/
© (2017) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE).
https://rightsstatements.org/vocab/InC/1.0/
© (2017) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE).
https://rightsstatements.org/vocab/InC/1.0/
Julkaisun pysyvä osoite on
https://urn.fi/URN:NBN:fi-fe2019042613368
https://urn.fi/URN:NBN:fi-fe2019042613368
Tiivistelmä
Abstract
In digital holographic microscopy, one often obtains an in-focus image of the sample by applying a focus metric to a stack of numerical reconstructions. We present an alternative approach using a deep convolutional neural network.
Kokoelmat
- Avoin saatavuus [32026]