Elasto-optic behaviour in epitaxial films of perovskite oxide ferroelectrics
|Author:||Dejneka, Alexandr1; Tyunina, Marina1,2|
1Institute of Physics, Academy of Sciences of the Czech Republic, Czech Republic
2Faculty of Information Technology and Electrical Engineering, Microelectronics Research Unit, University of Oulu, Oulu, Finland
|Online Access:||PDF Full Text (PDF, 0.6 MB)|
|Persistent link:|| http://urn.fi/urn:nbn:fi-fe2019051315290
|Publish Date:|| 2019-06-27
Large variations of refractive index in the visible spectral range are obtained in epitaxial perovskite oxide ferroelectric films experiencing lattice strain. The strain is imposed by substrates, on top of which the films are grown. The optical constants are determined using the spectroscopic ellipsometry. As a reference and for comparison, also prototype single crystals are inspected. The variations in refraction are related to the lattice strain in the films. Elasto-optic coefficient is formally estimated using the out-of-plane lattice elongation or shrinkage in the films compared to bulk. The obtained elasto-optic coefficients exceed significantly those previously reported for ferroelectric materials.
Advances in applied ceramics
|Pages:||62 - 65|
|Type of Publication:||
A1 Journal article – refereed
|Field of Science:||
114 Physical sciences
The authors acknowledge support from the Czech Science Foundation (Grantová Agentura České Republiky (GAČR)) (Grant Nos. 15-13778S and 15-15123S).
© Taylor & Francis. This is an Accepted Manuscript of an article published by Taylor & Francis in Advances in Applied Ceramics 117:1, available online: