V. Gartnerova, O. Pacherova, M. Klinger, M. Jelinek, A. Jager, M. Tyunina, Strain fluctuations in BaTiO3/SrTiO3 heterostructures, Materials Research Bulletin, Volume 89, 2017, Pages 180-184, ISSN 0025-5408, https://doi.org/10.1016/j.materresbull.2017.01.048.
Strain fluctuations in BaTiO₃/SrTiO₃ heterostructures
|Author:||Gartnerova, V.1; Pacherova, O.2; Klinger, M.1;|
1Laboratory of Nanostructures and Nanomaterials, Institute of Physics, CAS, Na Slovance 2, 182 21 Prague, Czechia
2Institute of Physics, CAS, Na Slovance 2, 182 21 Prague, Czechia
3Microelectronics Research Unit, Faculty of Information Technology and Electrical Engineering, University of Oulu, P.O. Box 4500, FI-90014, Finland
|Online Access:||PDF Full Text (PDF, 0.6 MB)|
|Persistent link:|| http://urn.fi/urn:nbn:fi-fe2019051315368
|Publish Date:|| 2019-05-13
Epitaxy of perovskite oxide ferroelectric heterostructures with large lattice misfit is crucial for numerous emerging applications. Here we demonstrate cube-on-cube-type epitaxial growth of BaTiO₃ films on strongly mismatched (001)SrTiO₃ single-crystal substrates for the films with thicknesses significantly larger than that of misfit relaxation. The films experience strain originating from the film-substrate thermal expansion mismatch. Using a dedicated digital analysis of electron microscopy images, we show that the films contain random nanoregions of substantial strain fluctuations: the local strains vary in the range of ∼(0.5–2)% compared with the average strain magnitude of ∼1%. Because of strong strain-polarization coupling in ferroelectrics, fluctuations of strain produce fluctuations of polarization, which are suggested to cause relaxor-like properties in many mismatched heterostructures.
Materials research bulletin
|Pages:||180 - 184|
|Type of Publication:||
A1 Journal article – refereed
|Field of Science:||
216 Materials engineering
The work was supported by the Grant Agency of the Czech Republic (Grant No. 15-15123S).
© 2017 Elsevier Ltd. All rights reserved. This manuscript version is made available under the CC-BY-NC-ND 4.0 license http://creativecommons.org/licenses/by-nc-nd/4.0/.