University of Oulu

Appl. Phys. Lett. 112, 052901 (2018); View online: https://doi.org/10.1063/1.5017667

Dielectric relaxation in epitaxial films of paraelectric-magnetic SrTiO₃-SrMnO₃ solid solution

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Author: Savinov, M.1; Bovtun, V.1; Tereshina-Chitrova, E.1;
Organizations: 1Institute of Physics of the Czech Academy of Sciences, Na Slovance 2, 18221 Prague, Czech Republic
2Microelectronics Research Unit, Faculty of Information Technology and Electrical Engineering, University of Oulu, P. O. Box 4500, FI-90014 Oulu, Finland
Format: article
Version: published version
Access: open
Online Access: PDF Full Text (PDF, 0.8 MB)
Persistent link: http://urn.fi/urn:nbn:fi-fe2019051315381
Language: English
Published: , 2018
Publish Date: 2019-05-13
Description:

Abstract

Magneto-dielectric properties of (A²⁺)MnO₃-type perovskites are attractive for applications and stimulate extensive studies of these materials. Here, the complex dielectric and magnetic responses are investigated as in epitaxial films of SrTi₀.₆Mn₀.₄O₃, solid solution of paraelectric SrTiO₃ and magnetic SrMnO₃. The impedance and resonance measurements at frequencies of 10⁻²–10¹⁰ Hz and temperatures of 10–500 K reveal broad dielectric anomalies centered at 100–200 K, while the films are paramagnetic at all temperatures. Analysis shows polaronic electrical conductivity behind the observed behavior. Electron-phonon correlations, rather than spin-phonon correlations, are suggested to produce the apparent magneto-dielectric responses in many multiferroic manganites.

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Volume: 112
Issue: 5
Article number: 052901
DOI: 10.1063/1.5017667
OADOI: https://oadoi.org/10.1063/1.5017667
Type of Publication: A1 Journal article – refereed
Field of Science: 114 Physical sciences
Subjects:
Funding: The authors acknowledge support from the Grant Agency of the Czech Republic (Grant No. 15-15123S). Research facilities of the Center for Advanced Functional Materials (SAFMAT) and the Magnetism and Low Temperature Laboratories (MLTL) were employed in this work.
Copyright information: © 2018 Authors. Published by the American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. This article appeared in Applied Physics Letters 112:5 and may be found at https://doi.org/10.1063/1.5017667.