University of Oulu

Remes, K., Järvenpää, A., Fabritius, T. (2019) Contactless online characterization of large-area conductive thin films by thermography and induction. Optics Letters 44 (10), 2574-2577. https://doi.org/10.1364/OL.44.002574

Contactless online characterization of large-area conductive thin films by thermography and induction

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Author: Remes, Kari1; Järvenpää, Antti2; Fabritius, Tapio1
Organizations: 1Optoelectronics and Measurement Techniques, Faculty of Information Technology and Electrical Engineering, University of Oulu, Erkki Koiso-Kanttilankatu 3, 90570 Oulu, Finland
2Future Manufacturing Technologies, Kerttu Saalasti Institute, University of Oulu, Pajatie 5, 85500 Nivala, Finland
Format: article
Version: accepted version
Access: open
Online Access: PDF Full Text (PDF, 0.5 MB)
Persistent link: http://urn.fi/urn:nbn:fi-fe2019081324112
Language: English
Published: Optical Society of America, 2019
Publish Date: 2020-05-15
Description:

Abstract

Testing and characterization techniques intended for traditional electronics production are rarely compatible with modern large-area, thin film electronics manufacturing processes such as roll-to-roll fabrication. Online quality monitoring of conductive thin films is necessary for upscaling and maintaining high-yield production. Thermography has already shown its usefulness in these kinds of applications, but has suffered from the lack of proper non-contact electrical heating. Now a fully contactless quality inspection technique based on thermal imaging and induction heating is implemented and evaluated. This approach is capable of discovering defected areas and estimating conductivity degradation online with full coverage over conductive thin films.

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Series: Optics letters
ISSN: 0146-9592
ISSN-E: 1539-4794
ISSN-L: 0146-9592
Volume: 44
Issue: 10
Pages: 2574 - 2577
DOI: 10.1364/OL.44.002574
OADOI: https://oadoi.org/10.1364/OL.44.002574
Type of Publication: A1 Journal article – refereed
Field of Science: 213 Electronic, automation and communications engineering, electronics
Subjects:
Funding: Academy of Finland, Finnish Research Infrastructure 2018 (FIRI 2018) (320017).
Academy of Finland Grant Number: 320017
Detailed Information: 320017 (Academy of Finland Funding decision)
Copyright information: © 2019 Optical Society of America. This is a post-peer-review, pre-copyedit version of an article published in Optics Letters. The final authenticated version is available online at: https://doi.org/10.1364/OL.44.002574.