University of Oulu

C. Schuss et al., "Defect localisation in photovoltaic panels with the help of synchronized thermography," 2017 IEEE International Instrumentation and Measurement Technology Conference (I2MTC), Turin, 2017, pp. 1-6. doi: 10.1109/I2MTC.2017.7969889

Defect localisation in photovoltaic panels with the help of synchronized thermography

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Author: Schuss, Christian1; Remes, Kari2; Leppänen, Kimmo3;
Organizations: 1Circuits and Systems (CAS), University of Oulu, Finland
2Optoelectronics and Measurement Techniques Laboratory, University of Oulu, Finland
3Oy G.W. Berg & Co Ab, Finland
4Institute of Electronic Sensor Systems, Graz University of Technology, Austria
Format: article
Version: accepted version
Access: open
Online Access: PDF Full Text (PDF, 2.1 MB)
Persistent link: http://urn.fi/urn:nbn:fi-fe2019090226395
Language: English
Published: Institute of Electrical and Electronics Engineers, 2017
Publish Date: 2019-09-02
Description:

Abstract

This paper investigates defects in photovoltaic (PV) panels, more precisely, the location of defects in PV panels. With the help of electrical verification, it is possible to verify the impact of defects on output performances. However, it is not possible to determine the location of defects in order to address problems, for example in the manufacturing process of PV panels. In this paper, the focus lies on finding similarities in the location of defect areas in PV panels. Samples were characterised with the help of synchronized thermography (ST) in order to obtain infrared (IR) images of PV panels. IR-images are helpful to get a visual image on the health of PV panels and identify the position of defects. This information can be useful, for example to improve the fabrication process of PV panels.

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ISBN: 978-1-5090-3596-0
ISBN Print: 978-1-5090-3597-7
Pages: 1 - 6
DOI: 10.1109/I2MTC.2017.7969889
OADOI: https://oadoi.org/10.1109/I2MTC.2017.7969889
Host publication: 2017 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)
Conference: IEEE International Instrumentation and Measurement Technology Conference
Type of Publication: A4 Article in conference proceedings
Field of Science: 213 Electronic, automation and communications engineering, electronics
Subjects:
Funding: We wish to thank Infotech Oulu and the Faculty of Information Technology and Electrical Engineering of the University of Oulu for financially supporting this research.
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