University of Oulu

Antila, J., Karhu, T., Mottonen, M., Harkonen, J., Belt, P. (2008) Reducing test costs in electronics mass-production. International Journal of Services and Standards, 4 (4), 393.

Reducing test costs in electronics mass-production

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Author: Antila, Jukka1; Karhu, Timo1; Möttönen, Matti2;
Organizations: 1Nokia Siemens Networks, P.O. Box 319, FI-90651 Oulu, Finland
2Department of Industrial Engineering and Management, University of Oulu, Finland, P.O. Box 4610, FI-90014 University of Oulu, Finland
Format: article
Version: accepted version
Access: open
Online Access: PDF Full Text (PDF, 0.3 MB)
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Language: English
Published: Inderscience, 2008
Publish Date: 2020-02-12


This paper studies the simultaneous optimisation of quality and costs in mass-production of complex electronics products. Testing has become a critical bottleneck for assuring quality, requiring a large amount of time and resources. The volume of especially functional testing must be minimised to reduce costs. Sampling is a potential way to obtain this. Unfortunately, existing sampling methods are not functional in the modern electronics environment with multiple tests. This paper presents new efficient methods, based on continuous sampling plan (CSP) procedures. The applicability of the developed methods is confirmed empirically by analysing and simulating real industrial data.

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Series: International journal of services and standards
ISSN: 1740-8849
ISSN-E: 1740-8857
ISSN-L: 1740-8849
Volume: 4
Issue: 4
Pages: 393 - 406
DOI: 10.1504/IJSS.2008.020055
Type of Publication: A1 Journal article – refereed
Field of Science: 222 Other engineering and technologies
Copyright information: © 2008 Inderscience Publishers. The final authenticated version is available online at