University of Oulu

Sjoblom, P., Todorescu, G. & Urpelainen, S. (2020). J. Synchrotron Rad. 27, 272-283.

Understanding the mechanical limitations of the performance of soft X-ray monochromators at MAX IV laboratory

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Author: Peter Sjöblom1; Todorescu, Gabriela1; Urpelainen, Samuli1,2
Organizations: 1MAX IV Laboratory, Fotongatan 2, 225 94 Lund, Sweden
2Nano and Molecular Systems Research Unit, PO Box 3000, FI-90014 University of Oulu, Finland
Format: article
Version: published version
Access: open
Online Access: PDF Full Text (PDF, 2.9 MB)
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Language: English
Published: International Union of Crystallography, 2020
Publish Date: 2020-04-20


MAX IV is a fourth-generation, or diffraction-limited, synchrotron light source with a number of state-of-the-art beamlines. The performance of a beamline is, to a high degree, set by the energy resolution it can achieve, which in turn is governed to a large extent by the monochromator. During the design phase of a monochromator, the mechanical requirements must be fully understood and met with margin. During commissioning, the performance must be verified and optimized. In this paper, six soft X-ray monochromators at MAX IV beamlines (Bloch, Veritas, HIPPIE, SPECIES, FinEstBeAMS and SoftiMAX) are examined with a focus on their resolving power, energy range and the time required to change measurement range, as those parameters are dependent on each other. The monochromators have a modern commercial design, planned and developed in close collaboration with the vendors. This paper aims to present the current status of the commissioning at MAX IV with emphasis on elucidating the mechanical limitations on the performance of the monochromators. It contains analysis of the outcome and our approach to achieve fast and high-resolution monochromators.

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Series: Journal of synchrotron radiation
ISSN: 0909-0495
ISSN-E: 1600-5775
ISSN-L: 0909-0495
Volume: 27
Pages: 272 - 283
DOI: 10.1107/S1600577520000843
Type of Publication: A1 Journal article – refereed
Field of Science: 114 Physical sciences
Copyright information: © 2020 The Authors. CC-BY.