University of Oulu

"Guest Editorial: Metrology for 5G Technologies," in IET Microwaves, Antennas & Propagation, vol. 13, no. 15, pp. 2581-2583, 18 12 2019, doi: 10.1049/iet-map.2019.0982

Guest editorial : metrology for 5G technologies

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Author: Fan, Wei1; Chen, Xiaoming2; Kyösti, Pekka3,4;
Organizations: 1Antennas, Propagation and Millimeter-wave Systems (APMS) Section at Aalborg University
2Xi'an Jiaotong University, Xi'an, China
3Keysight Technologies Finland Oy, Oulu
4University of Oulu
5Keysight at 3PP RAN plenary
6University of Surrey
7University of Cambridge
Format: article
Version: accepted version
Access: open
Online Access: PDF Full Text (PDF, 0.3 MB)
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Language: English
Published: Institution of Electrical Engineers, 2019
Publish Date: 2020-10-26
Series: IET microwaves, antennas & propagation
ISSN: 1751-8725
ISSN-E: 1751-8733
ISSN-L: 1751-8725
Volume: 13
Issue: 15
Pages: 2581 - 2583
DOI: 10.1049/iet-map.2019.0982
Type of Publication: B1 Journal article
Field of Science: 213 Electronic, automation and communications engineering, electronics
Copyright information: © Institution of Engineering and Technology 2019. Self-archived here with the kind permission of the publisher. The Definitive Version of Record can be found online at