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Guest editorial : metrology for 5G technologies |
|---|---|
| Author: | Fan, Wei1; Chen, Xiaoming2; Kyösti, Pekka3,4; |
| Organizations: |
1Antennas, Propagation and Millimeter-wave Systems (APMS) Section at Aalborg University 2Xi'an Jiaotong University, Xi'an, China 3Keysight Technologies Finland Oy, Oulu
4University of Oulu
5Keysight at 3PP RAN plenary 6University of Surrey 7University of Cambridge |
| Format: | article |
| Version: | accepted version |
| Access: | open |
| Online Access: | PDF Full Text (PDF, 0.3 MB) |
| Persistent link: | http://urn.fi/urn:nbn:fi-fe2020102687673 |
| Language: | English |
| Published: |
Institution of Electrical Engineers,
2019
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| Publish Date: | 2020-10-26 |
| Series: |
IET microwaves, antennas & propagation |
| ISSN: | 1751-8725 |
| ISSN-E: | 1751-8733 |
| ISSN-L: | 1751-8725 |
| Volume: | 13 |
| Issue: | 15 |
| Pages: | 2581 - 2583 |
| DOI: | 10.1049/iet-map.2019.0982 |
| OADOI: | https://oadoi.org/10.1049/iet-map.2019.0982 |
| Type of Publication: |
B1 Journal article |
| Field of Science: |
213 Electronic, automation and communications engineering, electronics |
| Subjects: | |
| Copyright information: |
© Institution of Engineering and Technology 2019. Self-archived here with the kind permission of the publisher. The Definitive Version of Record can be found online at https://doi.org/10.1049/iet-map.2019.0982. |