Structural phase transitions to 2D and 3D oxygen vacancy patterns in a perovskite film induced by electrical and mechanical nanoprobing |
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Author: | Yao, Lide1; Inkinen, Sampo1; Komsa, Hannu-Pekka2,3; |
Organizations: |
1NanoSpin, Department of Applied Physics, Aalto University School of Science, P.O. Box 15100, Aalto, FI‐00076 Finland 2Department of Applied Physics, Aalto University School of Science, P.O. Box 11100, Aalto, FI‐00076 Finland 3Microelectronics Research Unit, Faculty of Information Technology and Electrical Engineering, University of Oulu, Oulu, FI‐90014 Finland |
Format: | article |
Version: | published version |
Access: | open |
Online Access: | PDF Full Text (PDF, 1.9 MB) |
Persistent link: | http://urn.fi/urn:nbn:fi-fe2021042010982 |
Language: | English |
Published: |
John Wiley & Sons,
2021
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Publish Date: | 2021-04-20 |
Description: |
AbstractOxygen vacancy migration and ordering in perovskite oxides enable manipulation of material properties through changes in the cation oxidation state and the crystal lattice. In thin‐films, oxygen vacancies conventionally order into equally spaced planes. Here, it is shown that the planar 2D symmetry is broken if a mechanical nanoprobe restricts the chemical lattice expansion that the vacancies generate. Using in situ scanning transmission electron microscopy, a transition from a perovskite structure to a 3D vacancy‐ordered phase in an epitaxial La2/3Sr1/3MnO3–δ film during voltage pulsing under local mechanical straining is imaged. The never‐before‐seen ordering pattern consists of a complex network of distorted oxygen tetrahedra, pentahedra, and octahedra that, together, produce a corrugated atomic structure with lattice constants varying between 3.5 and 4.6 Å. The giant lattice distortions respond sensitively to strain variations, offering prospects for non‐volatile nanoscale physical property control driven by voltage and gated by strain. see all
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Series: |
Small |
ISSN: | 1613-6810 |
ISSN-E: | 1613-6829 |
ISSN-L: | 1613-6810 |
Volume: | 17 |
Issue: | 10 |
Article number: | 2006273 |
DOI: | 10.1002/smll.202006273 |
OADOI: | https://oadoi.org/10.1002/smll.202006273 |
Type of Publication: |
A1 Journal article – refereed |
Field of Science: |
114 Physical sciences 116 Chemical sciences 216 Materials engineering 213 Electronic, automation and communications engineering, electronics |
Subjects: | |
Funding: |
This work was supported by the Academy of Finland (Grant Nos. 293929, 304291, 319218, 311058, and 316857). In situ STEM analysis was conducted at the Aalto University OtaNano‐Nanomicroscopy Center (Aalto‐NMC). |
Copyright information: |
2021 The Authors. Small published by Wiley-VCH GmbH. This is an open access article under the terms of the Creative Commons Attribution License, which permits use, distribution and reproduction in any medium, provided the original work is properly cited. |
https://creativecommons.org/licenses/by/4.0/ |