University of Oulu

T. Park, G. Lee, W. Saad and M. Bennis, "Sum Rate and Reliability Analysis for Power-Domain Nonorthogonal Multiple Access (PD-NOMA)," in IEEE Internet of Things Journal, vol. 8, no. 12, pp. 10160-10169, 15 June15, 2021, doi: 10.1109/JIOT.2021.3050990

Sum rate and reliability analysis for power-domain nonorthogonal multiple access (PD-NOMA)

Saved in:
Author: Park, Taehyeun1; Lee, Gilsoo1; Saad, Walid1;
Organizations: 1Wireless@VT, Bradley Department of Electrical and Computer Engineering, Virginia Tech, Blacksburg, VA, USA
2Centre for Wireless Communication, University of Oulu, Finland
Format: article
Version: accepted version
Access: open
Online Access: PDF Full Text (PDF, 0.3 MB)
Persistent link: http://urn.fi/urn:nbn:fi-fe2021101250676
Language: English
Published: Institute of Electrical and Electronics Engineers, 2021
Publish Date: 2021-10-12
Description:

Abstract

Nonorthogonal multiple access (NOMA) is seen as an important technology for tomorrow’s Internet-of-Things (IoT) systems. In uplink power-domain NOMA (PD-NOMA), allocating the uplink transmit power of the IoT devices is important to maximize both the sum rate and the reliability of devices. However, it is challenging to optimize the uplink transmit power when the received signal power is affected by a random fading channel. Hence, in this article, the problem of uplink transmit power assignment is studied for a wireless network with PD-NOMA that serves uplink IoT services. This is posed as a problem of determining the target received signal power at the base station (BS) so that the reliability and upper bound of sum rate of the users are jointly maximized, where the received signal power at the BS is unknown to the devices due to Nakagami- $m$ fading channel. To find an optimal allocation of the lower and higher target received power values for the devices using PD-NOMA, the reliability and upper bound of sum rate are derived in terms of target received power values and power difference threshold. For a special case of Nakagami- $m$ fading channel, the theoretical analysis shows that the highest reliability and the highest upper bound of sum rate are achieved, when the target received power values are highest. For a general Nakagami- $m$ fading channel, simulation results show that there is a tradeoff between reliability and sum-rate upper bound and, thus, allocation of lower and higher target received power values is necessary to satisfy the communication requirements of IoT devices. Moreover, for a special case of Nakagami- $m$ fading channel, simulation results show that the derived optimal transmit power achieves the optimal sum-rate upper bound and reliability, and the target received power values of two devices must be highest for the maximum upper bound of sum rate and reliability. Furthermore, in simulation results, increasing the lower and higher target received power values increases both the upper bound of sum rate and reliability.

see all

Series: IEEE internet of things journal
ISSN: 2327-4662
ISSN-E: 2327-4662
ISSN-L: 2327-4662
Volume: 8
Issue: 12
Pages: 10160 - 10169
Article number: 9320531
DOI: 10.1109/JIOT.2021.3050990
OADOI: https://oadoi.org/10.1109/JIOT.2021.3050990
Type of Publication: A1 Journal article – refereed
Field of Science: 213 Electronic, automation and communications engineering, electronics
Subjects:
Funding: This research was supported by the U.S. National Science Foundation under Grant CNS-1836802, Academy of Finland project SMARTER, MISSION, EU-CHISTERA LearningEdge, Infotech-NOOR, and NEGEI. Part of this work was done by G. Lee, while he was a graduate student at Virginia Tech.
Copyright information: © 2021 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.