University of Oulu

I. Muhammad, H. Alves, N. H. Mahmood, O. L. A. López and M. Latva-aho, "Mission Effective Capacity—A Novel Dependability Metric: A Study Case of Multiconnectivity-Enabled URLLC for IIoT," in IEEE Transactions on Industrial Informatics, vol. 18, no. 6, pp. 4180-4188, June 2022, doi: 10.1109/TII.2021.3103406

Mission effective capacity: a novel dependability metric : a study case of multiconnectivity-enabled URLLC for IIoT

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Author: Muhammad, Irfan1; Alves, Hirley1; Mahmood, Nurul Huda1;
Organizations: 1Centre for Wireless Communications, University of Oulu, 90570 Oulu, Finland
Format: article
Version: published version
Access: open
Online Access: PDF Full Text (PDF, 1 MB)
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Language: English
Published: Institute of Electrical and Electronics Engineers, 2022
Publish Date: 2022-08-29


Various industrial Internet of Things applications demand execution periods throughout which no communication failure is tolerated. However, the classical understanding of reliability in the context of ultra-reliable low-latency communication (URLLC) does not reflect on the time-varying characteristics of the wireless channel. In this article, we introduce a novel mission reliability and mission effective capacity metric that takes these phenomena medium into account, while specifically studying multiconnectivity (MC)-enabled industrial radio systems. We assume uplink short packet transmission with no channel state information at URLLC user (the transmitter) and sporadic traffic arrival. Moreover, we leverage the existing framework of dependability theory and provide closed-form expressions (CFEs) for the mission reliability of the MC system using the maximal-ratio combining scheme. We do so by utilizing the mean time to first failure, which is the expected time of failure occurring for the first time. Moreover, we also derive exact CFEs for second-order statistics, such as level crossing rate and average fade duration, showing how fades are distributed in fading channels with respect to time. Furthermore, the design throughput maximization problem under the mission reliability constraint is solved numerically through the cross-entropy method.

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Series: IEEE transactions on industrial informatics
ISSN: 1551-3203
ISSN-E: 1941-0050
ISSN-L: 1551-3203
Volume: 18
Issue: 6
Pages: 4180 - 4188
DOI: 10.1109/tii.2021.3103406
Type of Publication: A1 Journal article – refereed
Field of Science: 213 Electronic, automation and communications engineering, electronics
Funding: This work was supported bythe Academy of Finland through 6Genesis Flagship under Grant 318937 and through EE-IoT Project under Grant 319008.
Academy of Finland Grant Number: 319008
Detailed Information: 319008 (Academy of Finland Funding decision)
Copyright information: © The Author(s) 2022. This work is licensed under a Creative Commons Attribution 4.0 License. For more information, see