University of Oulu
Oulu University Library
OuluCRIS
Laturi
Muuntaja

Similar Items

Cover Image

I. A. Prudaev, S. N. Vainshtein, V. V. Kopyev, V. L. Oleinik and S. N. Marochkin, "Suppression of Dynamic Current Leakage in Avalanche S-Diode Switching Circuits," in IEEE Electron Device Letters, vol. 43, no. 1, pp. 100-103, Jan. 2022, doi: 10.1109/LED.2021.3130596

Suppression of dynamic current leakage in avalanche S-diode switching circuits

Saved in:
Author: Prudaev, Ilya A.1,2; Vainshtein, Sergey N.3,4; Kopyev, Viktor V.5;
Organizations: 1Department of Semiconductor Electronics, Tomsk State University, 634050 Tomsk, Russia
2Avalanche Electronics LLC, 634512 Tomsk, Russia
3MilliLab, Department of Electronics and Nanoengineering, Aalto University, 02150 Espoo, Finland
4Faculty of Information Technology and Electrical Engineering, CAS Research Units, University of Oulu, 90014 Oulu, Finland
5Laboratory of Nonequilibrium Effects in Semiconductor Electronics, Research and Development Center “AET,” Tomsk State University, 634050 Tomsk, Russia
Format: article
Version: accepted version
Access: open
Online Access: PDF Full Text (PDF, 0.3 MB)
Persistent link: http://urn.fi/urn:nbn:fi-fe2022083056767
Language: English
Published: Institute of Electrical and Electronics Engineers, 2022
Publish Date: 2022-08-30
Description:

Abstract

This work investigates the dynamic current leakage of \(S\)-diode, which is a GaAs-based avalanche switch doped with deep Fe acceptor traps. The dynamic leakage has negative effect on superfast switching parameters of this unique device, and here we suggest an original way of reducing the leakage by means of circuit design. It is shown that an additional bias for avalanche S-diode in the current pulse generation circuit forms a negatively charged layer of iron traps near the electron-injecting junction. As a result, the concentration of nonequilibrium electrons goes down, which leads to a decrease in leakage current by ∼3–4 times, and a rise in S-diode switching voltage. The results were obtained in the experimental study and are approved by calculation.

see all
Series: IEEE electron device letters
ISSN: 0741-3106
ISSN-E: 1558-0563
ISSN-L: 0741-3106
Volume: 43
Issue: 1
Pages: 100 - 103
Article number: 21505914
DOI: 10.1109/led.2021.3130596
OADOI: https://oadoi.org/10.1109/led.2021.3130596
Type of Publication: A1 Journal article – refereed
Field of Science: 213 Electronic, automation and communications engineering, electronics
Subjects:
avalanche breakdown
closing switches
diodes
microwave switches
pulse power systems
Article
Funding: This work was supported by the Russian Foundation for Basic Research (RFBR) under Project 20-08-00141.
Copyright information: © 2021 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.