Abstract

Moving to sub-THz frequencies introduces new challenges for wireless communications systems in terms of design, implementation, and testing. This paper presents a measurement technique for over-the-air (OTA) characterisation of sub-THz antennas at WR3.4 band (220‐330 GHz), and a silicon (Si) lens fed by an on-chip antenna is used as a test vehicle. In the proposed measurement technique, the received sub-THz AM-modulated test signal is downconverted to kHz-range using a square-law power detector. Measurements and simulations/calculations are used to compare several key antenna/link parameters. Agreement between the results is good, which shows that the proposed technique provides a good and less hardware-intensive alternative for sub-THz antenna measurements.