Time- and spectrally-resolved mesoscopic Raman and fluorescence imaging of carious enamel by a CMOS SPAD-based spectrometer |
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Author: | Kekkonen, Jere1; Talala, Tuomo1; Nissinen, Ilkka1 |
Organizations: |
1Circuits and Systems Research Unit, University of Oulu, Oulu, Finland |
Format: | article |
Version: | accepted version |
Access: | open |
Online Access: | PDF Full Text (PDF, 2.9 MB) |
Persistent link: | http://urn.fi/urn:nbn:fi-fe2023081897881 |
Language: | English |
Published: |
Institute of Electrical and Electronics Engineers,
2023
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Publish Date: | 2023-08-18 |
Description: |
AbstractDental caries is the most widespread non-communicable disease affecting 2.5 billion people worldwide. Recently various optical spectroscopy methods have gained a lot of interest in dental research and caries detection due to their noninvasive and nonionizing nature. We demonstrate here, to the best of our knowledge, for the first time simultaneous Raman, fluorescence intensity and fluorescence lifetime imaging of carious human enamel with a single device based on a time-resolved single-photon avalanche diode (SPAD) sensor fabricated in 110-nm CMOS technology. The sensor has identical 256 spectral channels each of them containing an integrated tunable 7-bit time-to-digital converter (TDC) enabling time- and spectrally-resolved photon counting. We were able to show with the spectrometer built around the CMOS SPAD sensor and by utilizing a simple unsupervised machine learning algorithm (K-means) that a more comprehensive and reliable images of the enamel and caries-affected regions can be obtained by combining the information from the three different optical spectroscopy methods. We believe that the technology presented here could pave the way for novel multimodal optical devices not only in dental research and clinical dentistry but also in other biomedical applications in which molecular and chemical changes are studied. see all
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Series: |
IEEE International Instrumentation and Measurement Technology Conference |
ISSN: | 2642-2069 |
ISSN-E: | 2642-2077 |
ISSN-L: | 2642-2069 |
ISBN: | 978-1-6654-5383-7 |
ISBN Print: | 978-1-6654-5384-4 |
Pages: | 1 - 6 |
DOI: | 10.1109/I2MTC53148.2023.10176025 |
OADOI: | https://oadoi.org/10.1109/I2MTC53148.2023.10176025 |
Host publication: |
2023 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) proceedings |
Conference: |
International Instrumentation and Measurement Technology Conference |
Type of Publication: |
A4 Article in conference proceedings |
Field of Science: |
213 Electronic, automation and communications engineering, electronics |
Subjects: | |
Copyright information: |
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