Mbugua, A.W., Chen, Y., Alfageme, S.T., Biarge, S.D. and Fan, W. (2023), Experimental characterization of scattering from the trihedral corner reflector in the E-band. Electron. Lett., 59: e12804. https://doi.org/10.1049/ell2.12804
Experimental characterization of scattering from the trihedral corner reflector in the E-band
|Author:||Mbugua, Allan Wainaina1; Chen, Yun2; Alfageme, Simon Tejero2;|
1Huawei Technologies Duesseldorf GmbH, Munich Research Center, Munich, Germany and the Antennas, Propagation and Millimetre-Wave Systems (APMS) Section, Aalborg University, Aalborg, Denmark
2Huawei Technologies Duesseldorf GmbH, Munich Research Center, Munich, Germany
3Antennas, Propagation and Millimetre-Wave Systems (APMS) Section, Aalborg University, Aalborg, Denmark
4Center for Wireless Communication (CWC), Oulu University, Oulu, Finland
|Online Access:||PDF Full Text (PDF, 0.8 MB)|
|Persistent link:|| http://urn.fi/urn:nbn:fi-fe20231018140545
Institution of Engineering and Technology,
|Publish Date:|| 2023-10-18
Canonical objects with known radar cross section (RCS), for example, the trihedral corner reflector (TCR), play a crucial role in the calibration of automotive radar sensors. Moreover, these canonical objects are also used in the validation of simulated RCS obtained using asymptotic methods, such as hybrid geometric optics (GO) and the physical optics (PO) based methods. However, accurate RCS prediction with asymptotic methods is highly dependent on the individual scattering mechanisms considered in a simulation, for example reflection and diffraction from the TCR surfaces and edges, respectively. Reliable measurements are therefore required to evaluate if a particular interaction mechanism can be neglected to reduce computation complexity without adversely affecting the accuracy of the predicted RCS. In this letter, the monostatic scattering characteristics of three metallic TCRs are investigated with varying geometrical sizes in the E-band, that is, from 60 GHz to 90 GHz. The ultra-wideband (UWB) measurements, which offer a high delay resolution, can enable the identification of the individual scattering mechanisms. Diffraction from the TCR edges is experimentally demonstrated to contribute to a non-negligible scattered power in this frequency band.
|Type of Publication:||
A1 Journal article – refereed
|Field of Science:||
213 Electronic, automation and communications engineering, electronics
This work was supported by Huawei Technologies Duesseldorf GmbH.
© 2023 The Authors. Electronics Letters published by John Wiley & Sons Ltd on behalf of The Institution of Engineering and Technology. This is an open access article under the terms of the Creative Commons Attribution License, which permits use, distribution and reproduction in any medium, provided the original work is properly cited.